Parker DA400 Contour Probe (DA-400-SERIES)

The DA-400 Contour Probe is a portable, self-contained device engineered to generate a magnetic field on or within ferrous-magnetic materials.

This reliable instrument integrates both selective AC and DC functions. The AC mode generates a powerful AC field for detecting surface defects and demagnetizing after inspection, while the DC mode produces a strong Half Wave Rectified DC field for identifying certain subsurface defects.

The controls and solid-state electronics are housed within a high-impact molded casing. Articulating legs enable the AC or DC field to be precisely applied to the inspection area on nearly any surface shape, whether in the lab, factory, or field site.

All Parker Contour Probes comply with the requirements of applicable specifications.

• IP51

• Versatility and powerful performance in a lightweight (8.5 lbs.) instrument

• Constant AC or Half Wave Rectified (DC) fields with the flip of a switch for the location of surface and some sub-surface defects

• Apply continuous fields and demagnetize too

• Use with dry powder, wet fluorescent or visible

• High impact molded housing

• One year repair/replacement guarantee

• Optional Y-400 Yoke Light where shown is available at additional cost.

• 230VAC model available with CE certification at an additional cost

Due to shipping regulations, aerosols must ship via ground delivery.

Optional Kits

AKIT

• Steel carrying case

• 1 lb. Red Powder

• 1 lb. Gray Powder

• PB-1 Applicator

PLA KIT

• Super tuff plastic carrying case

• 1 lb. Red Powder

• 1 lb. Gray Powder

• PB-1 Applicator