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Parker Research Contour Probes are ideal for magnetic particle inspections, producing magnetic fields on ferrous materials. These probes can have AC or DC functions, which are used to detect surface defects or weaknesses. A wide range of probes with AC functionality, DC functionality or both are available to suit application needs. We also offer kits that include battery packs, chargers, and carrying cases.
For more information about Parker Research Contour Probes, contact our knowledgeable sales engineers by calling 1-847-577-3980 or emailing info@bergeng.com.
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Product Code: B142
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Product Code: A410AC
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Product Code: B-200
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Product Code: B100AC
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Product Code: PM-50A
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Product Code: PM-50
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Product Code: AKIT
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Product Code: PL-A KIT
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Product Code: Y-200
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Product Code: YP20
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Product Code: Y300
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Product Code: Y400
