High-resolution Eddy Current Array probe for the precise detection and localization of the smallest surface defects
The High Resolution Array Probe enhances the mobile eddy current device TCM by offering a robust solution for applications requiring top-notch resolution and accurate defect localization. Equipped with 64 sensor elements and a track width of only 0.6 mm, the probe provides exceptionally detailed inspection data, effectively detecting even the tiniest surface defects.
The probe is ideally designed for inspecting borehole regions and other localized areas where maximum spatial resolution is essential. Its high-resolution sensor architecture allows for the precise assessment of indications and aids in identifying defects that are challenging to detect with traditional array solutions. Additionally, the wide scan width ensures efficient examination of larger surface areas.
An integrated optical encoder ensures precise position tracking of inspection data and functions reliably across a wide range of surfaces, from matte and dark to glossy finishes. Furthermore, the probe supports omnidirectional defect detection, enabling the identification of cracks and other defects regardless of their orientation.
Combined with the TCM ECA App, users benefit from automatic probe recognition, intuitive operation and comprehensive digital C-scan documentation. The result is a powerful and mobile inspection solution for demanding Eddy Current Array applications.
