Foerster High-resolution Eddy Current Array probe
SKU:
Array-Probe
$0.00
New product
FREE Ground Shipping
FREE Calibration
FREE Accessories
Intrinsically Safe
Intrinsically Safe
Product details
Tech support available
- Product code
- Array-Probe
- Original Code
- Original Code 2
- NSN
- Product weight
- 0.00
Description
High-resolution Eddy Current Array probe for the precise detection and localization of the smallest surface defects
The High Resolution Array Probe enhances the mobile eddy current device TCM by offering a robust solution for applications requiring top-notch resolution and accurate defect localization. Equipped with 64 sensor elements and a track width of only 0.6 mm, the probe provides exceptionally detailed inspection data, effectively detecting even the tiniest surface defects.
The probe is ideally designed for inspecting borehole regions and other localized areas where maximum spatial resolution is essential. Its high-resolution sensor architecture allows for the precise assessment of indications and aids in identifying defects that are challenging to detect with traditional array solutions. Additionally, the wide scan width ensures efficient examination of larger surface areas.
An integrated optical encoder ensures precise position tracking of inspection data and functions reliably across a wide range of surfaces, from matte and dark to glossy finishes. Furthermore, the probe supports omnidirectional defect detection, enabling the identification of cracks and other defects regardless of their orientation.
Combined with the TCM ECA App, users benefit from automatic probe recognition, intuitive operation and comprehensive digital C-scan documentation. The result is a powerful and mobile inspection solution for demanding Eddy Current Array applications.
Package Includes
Specifications
Frequency range: 0.1 – 5 MHz
Probe track width: 0.6 mm
Array inspection length: 40 mm
Number of elements: 64
Features
Maximum Resolution: 64 sensor elements with a track width of only 0.6 mm enable highly detailed defect detection and precise localization.
New Inspection Capabilities: The high spatial resolution reveals even the smallest surface defects and opens up inspection possibilities for areas that were previously difficult to assess.
Omnidirectional Defect Detection: Defects are reliably detected and evaluated regardless of their orientation.
Precise Position Tracking: The integrated optical encoder ensures accurate positioning of indications and reliable operation on a wide range of surface finishes.
Efficient Area Coverage: High resolution combined with a large scan width enables fast inspection of larger surfaces.
Seamless TCM Integration: Automatic probe recognition, intuitive operation and comprehensive C-scan documentation ensure efficient inspection workflows.
New product
FREE Ground Shipping
FREE Calibration
FREE Accessories
Intrinsically Safe
Intrinsically Safe
Product details
Tech support available
- Product code
- Array-Probe
- Original Code
- Original Code 2
- NSN
- Product weight
- 0.00
